Effect of resistivity on small edge localized mode
Effect of resistivity on small edge localized mode
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DOI：
10.1063/1.5038042
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发表时间：
2018-09
影响因子：
2.2
通讯作者：
N. Wu;S. Y. Chen;M. Mou;C. Tang
中科院分区：
文献类型：
--
作者：
N. Wu;S. Y. Chen;M. Mou;C. Tang
基于BOUT++的剥离-气球三场模块，研究了电阻率对小边缘局域模（ELM）的影响。ELM的尺寸随着电阻率的增加而增加，这归因于线性增长率和湍流强度。在高电阻率的情况下，大的线性增长率导致激烈的基座的初始崩溃，和短的纬向流的持续时间导致弱湍流抑制，导致更多的额外的能量损失在湍流传输阶段。本文的工作为认识小型ELM提供了一定的参考。
The effect of resistivity on small edge localized mode (ELM) is investigated based on the peeling-ballooning three-field module of BOUT++. The ELM size increases with increasing resistivity, which is attributed to both linear growth rate and turbulence intensity. In the high resistivity case, a large linear growth rate causes a fierce initial collapse of pedestal, and the short duration of the zonal flow results in weak turbulence suppression, leading to more additional energy loss in the turbulence transport phase. This work is expected to provide some reference on understanding small ELM.