A Two-Scale Scattering Model With Application to JONSWAP '75 Aircraft Microwave Scatterometer Experiment
A Two-Scale Scattering Model With Application to JONSWAP '75 Aircraft Microwave Scatterometer Experiment
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DOI：
10.56236/rss-aa
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发表时间：
1977-12
期刊：
影响因子：
--
通讯作者：
F. Wentz
中科院分区：
文献类型：
--
作者：
F. Wentz
对双尺度表面双基地散射的一般问题进行了分析。处理完全是二维的，并且是独立于任何特定坐标系的矢量公式。然后将双尺度散射模型应用于海面后向散射。特别是，将该模式与JONSWAP 1975年的飞机散射计测量相结合，确定了海面的两个尺度粗糙度分布，即大尺度表面斜率的概率密度和毛细波数谱。最佳拟合的归一化雷达散射截面的模型计算与垂直极化测量之间的平均误差为0.7dBRMS。通过线性最小二乘回归建立了分布参数与风速之间的相关关系。
The general problem of bistatic scattering from a two scale surface was evaluated. The treatment was entirely two-dimensional and in a vector formulation independent of any particular coordinate system. The two scale scattering model was then applied to backscattering from the sea surface. In particular, the model was used in conjunction with the JONSWAP 1975 aircraft scatterometer measurements to determine the sea surface's two scale roughness distributions, namely the probability density of the large scale surface slope and the capillary wavenumber spectrum. Best fits yield, on the average, a 0.7 dB rms difference between the model computations and the vertical polarization measurements of the normalized radar cross section. Correlations between the distribution parameters and the wind speed were established from linear, least squares regressions.