A fast simulation method for THGEM charging-up study
A fast simulation method for THGEM charging-up study
复制标题
THGEM充电研究的快速仿真方法
DOI：
10.1088/1748-0221/15/04/p04015
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发表时间：
2020-04
影响因子：
1.3
通讯作者：
邵明
中科院分区：
文献类型：
--
作者：
宋国锋;邵明
厚气体电子倍增器（THGEM）具有充电效应，导致探测器增益随时间的变化。对探测器充电过程的模拟有助于更好地了解探测器增益随时间的稳定性，这对此类探测器的设计和优化具有重要意义。基于加菲猫++工具包开发了迭代仿真方法和算法，仿真结果与实验观察结果一致。然而，这些模拟方法需要进行数百次迭代，并逐步计算绝缘体上的沉积电荷量，计算资源成本高，非常耗时。本文提出了一种快速迭代方法来模拟THGEM的充电效应。该方法通过连续计算电介质表面上的电场来估计沉积的电荷，该电场被认为直接有助于电荷积累。应用静电场叠加原理，利用表面电荷修正了THGEM的电场图。这种有效的方法在达到增益稳定之前只需要几次迭代。详细描述了模拟过程，模拟结果与实验数据吻合较好。
Thick gas electron multipliers (THGEM) exhibit a charging-up effect, causing detectors' gain evolution versus time. The simulation of charging-up process is helpful for better understanding of the detector's gain stability over time, which is important for the design and optimization of such detectors. Iterative simulation methods and algorithms based on the Garfield++ toolkit have been developed, and the results are in agreement with experimental observations. However, those simulation methods require hundreds of iterations and calculating the quantity of deposited charges on the insulator step by step, which has a high computing resource cost and is very time consuming. This work describes a fast iterative method to simulate the charging-up effect of THGEM. The method estimates the deposited charges by consecutively calculating the electric field on the dielectric surface, which is considered to directly contribute to the charge accumulation. The superposition theorem of static electric field is applied to update the electric field map of THGEM by surface charges. This efficient method only requires a few iterations before reaching gain stabilization. The detailed simulation process is described, and the simulation results fit the experimental data reasonably well.
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影响因子：
--
作者：
B. Stelzer
通讯作者：
B. Stelzer
影响因子：
1.3
作者：
M. Cortesi;J. Yurkon;W. Mittig;D. Bazin;S. Beceiro-Novo;A. Stolz
通讯作者：
M. Cortesi;J. Yurkon;W. Mittig;D. Bazin;S. Beceiro-Novo;A. Stolz
影响因子：
1.3
作者：
D. S. Renous;A. Roy;A. Breskin;S. Bressler
通讯作者：
D. S. Renous;A. Roy;A. Breskin;S. Bressler
影响因子：
1.3
作者：
M. Alexeev;R. Birsa;F. Bradamante;A. Bressan;M. Büchele;M. Chiosso;P. Ciliberti;S. Torre;S. Das
通讯作者：
M. Alexeev;R. Birsa;F. Bradamante;A. Bressan;M. Büchele;M. Chiosso;P. Ciliberti;S. Torre;S. Das
DOI：
10.1088/1742-6596/1498/1/012006
发表时间：
2019-07
期刊：
Journal of Physics: Conference Series
影响因子：
--
作者：
J. Agarwala;S. Torre;S. Dasgupta;M. Gregori;G. Hamar;S. Levorato;G. Menon;F. Tessarotto;Triloki;Y. Zhao;F. Bradamante;A. Bressan;C. Chatterjee;P. Ciliberti;Anna Martin;M. Alexeev;O. Denisov;M. Chiosso;D. Panzieri;C. Azevedo;J. Veloso;M. Büchele;H. Fischer;F. Herrmann;S. Schopferer;A. Cicuttin;M. Crespo;M. Finger;M. Slunecka;M. Sulc
通讯作者：
J. Agarwala;S. Torre;S. Dasgupta;M. Gregori;G. Hamar;S. Levorato;G. Menon;F. Tessarotto;Triloki;Y. Zhao;F. Bradamante;A. Bressan;C. Chatterjee;P. Ciliberti;Anna Martin;M. Alexeev;O. Denisov;M. Chiosso;D. Panzieri;C. Azevedo;J. Veloso;M. Büchele;H. Fischer;F. Herrmann;S. Schopferer;A. Cicuttin;M. Crespo;M. Finger;M. Slunecka;M. Sulc