Nanocomputing in the presence of defects and faults: a survey
Nanocomputing in the presence of defects and faults: a survey
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存在缺陷和故障的纳米计算：一项调查
DOI：
10.1007/1-4020-8068-9_2
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发表时间：
2004
期刊：
影响因子：
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通讯作者：
M. Gokhale
中科院分区：
文献类型：
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作者：
P. Graham;M. Gokhale
计算系统实现纳米技术将需要采用缺陷和容错措施，以提高其可靠性，由于大量的因素，可能会导致不完善的设备制造以及增加的敏感性，环境引起的故障时，使用纳米尺度的设备。研究人员已经从许多角度探讨了这个问题的可靠性，本次调查将讨论许多有前途的例子，从经典的容错技术，以具体的纳米计算方法。这里总结的研究结果还表明，许多有用的，但惊人的不同的解决方案可能存在容忍纳米计算系统中的缺陷和故障。调查中还包括一些软件工具，可用于量化存在缺陷和故障的纳米计算系统的可靠性。
Computing systems implemented with nanotechnology will need to employ defect- and fault-tolerant measures to improve their reliability due to the large number of factors that may lead to imperfect device fabrication as well as the increased susceptibility to environmentally induced faults when using nanometer-scale devices. Researchers have approached this problem of reliability from many angles and this survey will discuss many promising examples, ranging from classical fault-tolerant techniques to approaches specific to nanocomputing. The research results summarized here also suggest that many useful, yet strikingly different solutions may exist for tolerating defects and faults within nanocomputing systems. Also included in the survey are a number of software tools useful for quantifying the reliability of nanocomputing systems in the presence of defects and faults.