Structure and magnetic properties of SmCo5/X (X=Fe, Fe-Co, Co) magnetic bilayer films on MgO(110) substrate
Structure and magnetic properties of SmCo5/X (X=Fe, Fe-Co, Co) magnetic bilayer films on MgO(110) substrate
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DOI：
10.1016/j.jmmm.2016.12.061
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发表时间：
2017-10-15
影响因子：
2.7
通讯作者：
Inaba, Nobuyuki
中科院分区：
文献类型：
--
作者：
Suzuki, Ataru;Hotta, Yusuke;Inaba, Nobuyuki
采用超高真空分子束外延（UHV-MBE）技术，在MgO（110）衬底上异质外延生长bcc-Cr（211）、bcc-Fe（211）、bcc-Fe 65 Co 35（211）和hcp-Co（11（）00）底层，在500 ℃下制备了Sm 17 Co 83（at%）薄膜。用原位反射高能电子衍射和X射线衍射研究了薄膜的生长行为和结构。Sm-Co（11（.）00)c轴位于膜平面内的RT 5有序结构的单晶膜在底层上外延生长。小体积的非晶相被解释为参与在这些底层上沉积的膜。RT 5磁性薄膜的晶格由块状六方结构发生了轻微的变形，这可能是由于与底层的晶格失配引起的。在Cr衬底上沉积的薄膜的有序度（S=0.77）高于在Fe、Fe_（65）Co_（35）和Co衬底上沉积的薄膜的有序度（S：0.67-0.71）。薄膜表现出面内单轴磁各向异性，反映了SmCo 5晶体的磁晶各向异性。
Sm17Co83 (at%) films are prepared on bcc-Cr(211), bcc-Fe(211), bcc-Fe65Co35(211), and hcp-Co(11() 00) underlayers hetero-epitaxially grown on MgO(110) substrates at 500 degrees C by using a UHV-MBE system. The growth behavior and the structures are investigated by in-situ reflection high-energy electron diffraction and Xray diffraction. Sm-Co(11(.) 00) single-crystal films of RT5 ordered structure with the c-axis lying in the film plane grow epitaxially on the underlayers. Small volumes of amorphous phases are interpreted to be involved in the films deposited on these underlayers. The crystal lattice of RT5 magnetic film is slightly deformed from the bulk hexagonal structure, which is caused possibly by the lattice mismatch with the underlayer. The order degree of film deposited on Cr underlayer is higher (S=0.77) than those prepared on Fe, Fe65Co35, and Co underlayers (S: 0.67-0.71). The films show in-plane uniaxial magnetic anisotropies reflecting the magnetocrystalline anisotropy of SmCo5 crystal.