On synchronizing sequences and test sequence partitioning
On synchronizing sequences and test sequence partitioning
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关于同步序列和测试序列划分
DOI：
10.1109/vtest.1998.670864
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发表时间：
1998
期刊：
影响因子：
--
通讯作者：
S. Reddy
中科院分区：
文献类型：
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作者：
I. Pomeranz;S. Reddy
我们考虑两个主题有关的测试同步时序电路。第一个主题涉及同步电路及其同步序列。同步序列在促进可检测故障的测试生成过程和识别不可检测故障方面是重要的。它们在确定是否可以从电路中消除不可检测的故障而不影响其正常操作方面也很重要。我们展示了一类故障，故障电路的同步序列可以很容易地确定从无故障电路的同步序列。我们还考虑电路，有一个复位机制，并显示如何复位可以确保没有一个单一的故障会导致电路变得不同步。我们考虑的第二个主题涉及测试序列划分，以加速静态测试压缩。我们提出了一个程序，用于分区一个给定的测试序列到的累积故障覆盖率的所有序列，当作为独立的测试序列，是等于故障覆盖率的原始序列。然后，每个子序列可以被独立地压缩。
We consider two topics related to the testing of synchronous sequential circuits. The first topic deals with synchronizable circuits and their synchronizing sequences. Synchronizing sequences are important in facilitating the test generation process for detectable faults, and in identifying undetectable faults. They are also important in determining whether an undetectable fault can be removed from a circuit without affecting its normal operation. We show a class of faults for which a synchronizing sequence for the faulty circuit can be easily determined from the synchronizing sequence of the fault free circuit. We also consider circuits that have a reset mechanism, and show how reset can ensure that no single fault would cause the circuit to become unsynchronizable. The second topic we consider deals with test sequence partitioning to speed up static test compaction. We propose a procedure for partitioning a given test sequence into subsequences such that the cumulative fault coverage of all the subsequences, when applied as independent test sequences, is equal to the fault coverage of the original sequence. Each subsequence can then be compacted independently.