FTIR and Vis-FUV real time spectroscopic ellipsometry studies of polymer surface modifications during ion beam bombardment
FTIR and Vis-FUV real time spectroscopic ellipsometry studies of polymer surface modifications during ion beam bombardment
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DOI:
10.1016/j.nimb.2003.11.033
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发表时间:
2004-02-01
影响因子:
1.3
通讯作者:
Logothetidis, S
中科院分区:
文献类型:
--
作者:
Laskarakis, A;Gravalidis, C;Logothetidis, S
The continuously increasing application of polymeric materials in many scientific and technological fields has motivated an extensive use of polymer surface treatments, which modify the physical and chemical properties of polymer surfaces leading to surface activation and promotion of the surface adhesion. Fourier transform IR spectroscopic ellipsometry (FTIRSE) and phase modulated ellipsometry (PME) in the IR and Vis-FUV spectral regions respectively have been employed for in situ and real time monitoring of the structural changes on the polymer surface obtained by Ar+ ion bombardment. The polymers were industrially supplied polyethylene tereplithalate (PET) and polyethylene naphthalate (PEN) membranes. The Ar+ ion bombardment has found to change the chemical bonding of the films and especially the amount of the C=O, C-C and C=C groups. The detailed study of the FTIRSE spectra reveals important information about the effect of the Ar+ ion bombardment on each of the above bonding groups. Also, the modification of the characteristic features, attributed to electronic transitions in specific bonds of PET and PEN macromolecules, has been studied using PME. (C) 2003 Elsevier B.V. All rights reserved.