Study on Structure of Interfacial Films at Liquid/Liquid Interfaces by Synchrotron X-ray Reflection
Study on Structure of Interfacial Films at Liquid/Liquid Interfaces by Synchrotron X-ray Reflection
复制标题
同步辐射X射线反射研究液/液界面界面膜结构
DOI:
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发表时间:
2009
期刊:
影响因子:
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通讯作者:
瀧上隆智(invited)
中科院分区:
文献类型:
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作者:
中村文弥;瀧上隆智;et al.;瀧上隆智(invited)