A Review on Common Methods for Characterizing Graphene Oxide (GO)
A Review on Common Methods for Characterizing Graphene Oxide (GO)
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DOI：
10.9734/ajacr/2019/v4i230109
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发表时间：
2019-11
期刊：
影响因子：
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通讯作者：
Md. Shafiul Islam
中科院分区：
文献类型：
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作者：
Md. Shafiul Islam
氧化石墨烯，厚度为1.1±0.2 nm的二维材料，因其物理、化学、光学和电学等独特的性质而在科学领域受到更大程度的关注。氧化石墨烯（单层片）是通过将石墨（数百万层）氧化为氧化石墨（多层）而合成的，氧化石墨通过剥离、超声处理和离心法转化为氧化石墨烯，这种方法被称为“改进的Hummer”方法。我专注于氧化石墨烯的化学结构。然而，我讨论了不同的分析方法，如紫外-可见光谱、原子力显微镜 (AFM)、X 射线光电子能谱 (XPS)、傅里叶变换红外光谱 (FTIR) 以及用于表征氧化石墨烯的 X 射线衍射图。此外，本综述涵盖了氧化石墨烯的分析评估，并讨论了氧化石墨烯在科学界的过去、现在和未来。
Graphene oxide, two-dimensional material with the thickness of 1.1±0.2 nm, has gained attention to a greater extent in the field of science for its radically distinctive properties: physical, chemical, optical as well as electrical etc. Graphene oxide (monolayer sheet) has been synthesized by oxidizing graphite (millions of layer) to graphite oxide (multilayers) which has been converted into graphene oxide via exfoliation followed by sonication and centrifugation a method mentioned as Modified Hummer Method. I focus on the chemical structure of graphene oxide. However, I discuss the different analytical methods such as UV-Visible spectroscopy, Atomic Force Microscopy (AFM), X-ray Photoelectron Spectroscopy (XPS), Fourier Transform Infrared Spectroscopy (FTIR) as well as X-ray Diffraction pattern for characterizing the graphene oxide. Furthermore, this review covers the analytical evaluation of graphene oxide and discuss the past, present and future of graphene oxide in the scientific world.