Intermittent extremely low frequency electromagnetic fields cause DNA damage in a dose-dependent way
Intermittent extremely low frequency electromagnetic fields cause DNA damage in a dose-dependent way
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DOI：
10.1007/s00420-003-0446-5
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发表时间：
2003-07-01
影响因子：
3
通讯作者：
Rüdiger, HW
中科院分区：
文献类型：
--
作者：
Ivancsits, S;Diem, E;Rüdiger, HW
目标.流行病学研究报告了暴露于极低频电磁场（ELF-EMF）和癌症疾病风险增加之间的关联，尽管没有剂量效应关系。这些发现的有效性只能通过证明ELF-EMFs在体外人源细胞中的剂量依赖性DNA损伤作用来证实。方法.将培养的人二倍体成纤维细胞暴露于间歇性ELF电磁场。用碱性和中性彗星试验检测DNA损伤。结果ELF-EMF暴露（50 Hz，正弦，1-24 h，20- 1，000 μ T，5 min on/10 min off）诱导剂量依赖性和时间依赖性DNA单链和双链断裂。影响发生在低至35 μ T的磁通密度，远低于拟议的国际非电离辐射防护委员会（ICNIRP）的指导方针。终止暴露后，诱导的彗星尾因子在9 h内恢复正常。结论诱导的DNA损伤不是基于热效应，并引起了对ELF暴露的环境阈值限值的关注。
Objectives. Epidemiological studies have reported an association between exposure to extremely low frequency electromagnetic fields (ELF-EMFs) and increased risk of cancerous diseases, albeit without dose-effect relationships. The validity of such findings can be corroborated only by demonstration of dose-dependent DNA-damaging effects of ELF-EMFs in cells of human origin in vitro. Methods. Cultured human diploid fibroblasts were exposed to intermittent ELF electromagnetic fields. DNA damage was determined by alkaline and neutral comet assay. esults. ELF-EMF exposure (50 Hz, sinusoidal, 1-24 h, 20-1,000 muT, 5 min on/10 min off) induced dose-dependent and time-dependent DNA single-strand and double-strand breaks. Effects occurred at a magnetic flux density as low as 35 muT, being well below proposed International Commission of Non-Ionising Radiation Protection (ICNIRP) guidelines. After termination of exposure the induced comet tail factors returned to normal within 9 h. Conclusion. The induced DNA damage is not based on thermal effects and arouses concern about environmental threshold limit values for ELF exposure.