Diamond radiation detector made of an ultrahigh-purity type IIa diamond crystal grown by high-pressure and high-temperature synthesis
Diamond radiation detector made of an ultrahigh-purity type IIa diamond crystal grown by high-pressure and high-temperature synthesis
复制标题
采用高压高温合成的超高纯IIa型金刚石晶体制成的金刚石辐射探测器
DOI:
10.1063/1.1319596
复制
发表时间:
2001
影响因子:
1.6
通讯作者:
Hideyo Ohkushi
中科院分区:
文献类型:
--
作者:
Teruya Tanaka;J. Kaneko;D. Takeuchi;H. Sumiya;M. Katagiri;T. Nishitani;H. Takeuchi;T. Iida;Hideyo Ohkushi
Synthetic diamondradiation detectors made of ultrahigh-purity type IIa diamond crystals were developed. The diamond crystals, which were grown by high-pressure and high-temperature synthesis, contained less nitrogen impurity than 0.1 ppm, i.e., 1/10 of conventional type IIa diamond crystals. Since the ultrahigh-purity type IIa diamond crystal was a p-type semiconductor due to a trace impurity of boron, a structure consisting of Schottky and ohmic contacts was adopted for the detectors to suppress an increase in leakage current. For the same purpose, a metal–insulator–semiconductor structure using a chemical vapor deposition diamond insulating layer was adopted for one of the detectors. Plural peaks were observed in the 5.486 MeV α energy spectra obtained by the detectors; motion of holes produced the main part of output pulses from the detectors on these measurements. One of the peaks in each spectrum was hardly influenced by light irradiation, even ultraviolet light of 370 nm (3.4 eV), compared with a peak obtained by the conventional type IIa diamondradiation detector. This experimental result indicated that there was a superior part in the crystal where deep energy levels did not exist so much. Although there was no direct evidence, influence of a distribution of the boron impurity in the crystal was expected. On the other hand, electron trapping severely occurred and resulted in loss in charge collection; an effect of the reduction in the nitrogen impurity was not confirmed on the behavior of electrons.
DOI:
--
发表时间:
2004
期刊:
Review of Scientific Instruments 75
影响因子:
--
作者:
J.H.Kaneko et al.
通讯作者:
J.H.Kaneko et al.