Nonlinear Time Series: Nonparametric and Parametric Methods
Nonlinear Time Series: Nonparametric and Parametric Methods
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DOI:
10.1198/tech.2004.s746
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发表时间:
2004-02
期刊:
影响因子:
2.5
通讯作者:
Z.Q. John Lu
中科院分区:
文献类型:
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作者:
Z.Q. John Lu
gain function (i.e., the absolute value of the transfer function) is here termed the “modulation transfer function.” Chapter 9, the rst chapter on statistical theory, discusses the statistical properties of the sample mean, weighted averages, sample variance, and sample median under various distributional assumptions about the underlying independent and identically distributed (iid) data (normal, binomial, and a specialized PDF proportional to the square of a sinc function). The discussions are generally good (particularly for the squared sinc function), although the one on weighted averages might prove to be too abstract for those with little experience in data analysis. Chapter 10 is supposedly a discussion of the estimation of probability laws. Ignoring its confusing introduction, this chapter starts promisingly enough with a section on the orthogonal function approach to estimating PDFs from iid data. A follow-up section discusses a variation involving a Karhunen– Loeve expansion, in which the author fails to point out the practical limitation that knowledge of the unknown PDF is needed to construct the orthogonal functions. After this section, the chapter takes off on a major departure. The data are no longer assumed to be iid realizations of RVs, but rather are taken to be perfectly known functions of the unknown PDF (e.g., our “data” are the mean and variance of the unknown PDF). Under this framework, the author discusses a Bayesian-like approach called the “principle of maximum probability” and relates it to the maximum entropy approach. From a purely mathematical standpoint, this material is fascinating and should be required reading for all advocates of the maximum entropy principle; unfortunately, because of the bizarre notion of what constitutes data, it is only marginally relevant to the statistical problem of PDF estimation. Chapters 11, 12, and 13 provide fairly standard discussions on the chisquared test for signi cance departures from a prespeci ed distribution, the one-sample t test for a mean and the F test for equality of the variances. Chapters 14 and 15 are bare bones introductions to least squares theory and principal components analysis, whereas Chapter 16 is basically a discussion of Bayesian statistical theory in the context of assessing whether or not coin ips are biased. The book’s nal chapter, 17, “Introduction to Estimation Methods,” starts with a nice overview of maximum likelihood estimators, the Cramer–Rao and Bhattacharyya lower bounds, and Bayesian estimation theory (although purists will object because of the lack of statements about conditions needed for various results to hold). However, as in Chapter 10, the text then takes a major departure away from what most Technometrics readers would consider statistical estimation theory. The author discusses a “Fisher information-based approach” that “aims to nd the true probability law describing a physical phenomenon by deriving a wave equation that de nes the law.” This portion of the chapter (which at times has the avor of a philosophical discussion) is evidently a synopsis of another book by the same author (Frieden 1998). Missing from this book are many topics that have received considerable attention over the last 20 years in Technometrics (bootstrapping and nonparametric regression being two prominent examples). This bias toward older techniques is probably explained by the fact that this book is the third edition of a text that rst appeared in 1983. The reference lists for Chapters 1–16 include only a smattering of papers and books that have appeared after 1990. (Indeed, the author has not even bothered to update the references for several books that themselves are now out in newer editions.) Chapter 17 does have numerous references from the last decade and seems to be the main motivation for this new edition, but owners of previous editions might look carefully at the Preface to this edition before purchasing. I am reluctant to recommend Probability, Statistical Optics and Data Testing as a textbook for beginning students because of its lack of coverage of important new topics in statistics and because of too many quirky nonstandard de nitions that will make it dif cult for students to then jump into the bulk of the statistical and engineering literature. There are, however, some real gems contained in the optical applications and the numerous exercises that the author provides. I would encourage instructors and students of the physical sciences to seek out this book for some challenging applications and statistical problems. Alas, in keeping with the generally dated avor of the book, the author states that “answers to selected problems may be obtained by writing to the author directly, and enclosing a stamped, self-addressed envelope (about 8 2 £ 11 in) for return”—an odd approach in an age of e-mail permitting bulky attachments.