Optical characterization of grain orientation in crystalline materials
Optical characterization of grain orientation in crystalline materials
复制标题
DOI：
10.1016/j.actamat.2020.05.027
复制
发表时间：
2020-08
期刊：
影响因子：
9.4
通讯作者：
B. Gaskey;Ludwig Hendl;Xiaogang Wang;M. Seita
中科院分区：
文献类型：
--
作者：
B. Gaskey;Ludwig Hendl;Xiaogang Wang;M. Seita
表征晶体取向对于评估结晶固体的结构-性能关系至关重要。虽然衍射方法在这一领域占据主导地位，但低通量和高成本限制了它们对小样本、专业样本的适用性，并限制了资金充足的研究机构的使用。我们开发了一种互补的方法，扩大了适用性和拓宽了访问范围。我们只用传统的光学显微镜和商用笔记本电脑演示了厘米尺度表面上的晶体取向映射。我们的方法依赖于一种新的分析方法，该方法将晶格取向与特殊蚀刻表面的光学反射率联系起来。我们成功地将该方法应用于金属和半导体表面。该方法的简单性、低成本和提高的样品吞吐量有望显著扩大晶体取向映射的可用性，使其易于在教育、学术研究和工业环境中使用。
Characterizing crystallographic orientation is essential for assessing structure-property relationships in crystalline solids. While diffraction methods have dominated this field, low throughput and high cost limit their applicability to small, specialized samples and restrict access to well-funded research institutions. We develop a complementary method that expands applicability and broadens access. We demonstrate crystal orientation mapping over centimeter-scale surfaces using nothing more than a conventional optical microscope and commercial laptop. Our approach relies on a novel analysis method that correlates crystal lattice orientation to optical reflectance of specially etched surfaces. We successfully apply the method to metal and semiconductor surfaces. The simplicity, low cost, and enhanced sample throughput of our method promise to expand the availability of crystallographic orientation mapping significantly, making it readily available in education as well as academic research and industrial settings.