Efficient Analysis of Photoluminescence Images for the Classification of Single-Photon Emitters
Efficient Analysis of Photoluminescence Images for the Classification of Single-Photon Emitters
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DOI：
10.1021/acsphotonics.2c00795
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发表时间：
2022-10-31
期刊：
影响因子：
7
通讯作者：
Bassett，Lee C.
中科院分区：
文献类型：
--
作者：
Narun，Leah R.;Fishman，Rebecca E. K.;Bassett，Lee C.
固态单光子发射器（SPE）是量子通信和量子传感等新兴技术的基础。基于荧光点缺陷的SPE在半导体和绝缘体中无处不在，具有量子信息科学所需特性的新系统可能存在于大量未探索的缺陷中。然而，新 SPE 的表征通常依赖于通过肉眼识别光致发光 (PL) 图像中的点源的耗时技术。这种手动策略是发现新 SPE 的瓶颈，激发了一种更有效的方法来表征 PL 图像中的发射器。在这里，我们提出了一种使用图像分析和回归拟合的定量方法，自动识别 PL 图像中的高斯发射体，并根据它们相对于背景的稳定性、形状和强度对它们进行分类。我们展示了纳米金刚石阵列和六方氮化硼薄片中 SPE 的有效发射器分类。尽管发射体强度、稳定性和背景特征存在差异，自适应标准仍可检测两个样本中的 SPE。可以针对特定材料系统和实验装置调整检测标准，以适应 SPE 的不同特性。
Solid-state single-photon emitters (SPE) are a basis for emerging technologies such as quantum communication and quantum sensing. SPE based on fluorescent point defects are ubiquitous in semiconductors and insulators, and new systems with desirable properties for quantum information science may exist among the vast number of unexplored defects. However, the characterization of new SPE typically relies on time-consuming techniques for identifying point sources by eye in photoluminescence (PL) images. This manual strategy is a bottleneck for discovering new SPE, motivating a more efficient method for characterizing emitters in PL images. Here, we present a quantitative method using image analysis and regression fitting to automatically identify Gaussian emitters in PL images and classify them according to their stability, shape, and intensity relative to the background. We demonstrate efficient emitter classification for SPE in nanodiamond arrays and hexagonal boron nitride flakes. Adaptive criteria detect SPE in both samples despite variation in emitter intensity, stability, and background features. The detection criteria can be tuned for specific material systems and experimental setups to accommodate the diverse properties of SPE.