X-ray emission as a diagnostic from pseudospark-sourced electron beams
X-ray emission as a diagnostic from pseudospark-sourced electron beams
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DOI：
10.1016/j.nimb.2014.06.008
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发表时间：
2014-09-15
影响因子：
1.3
通讯作者：
Li, D.
中科院分区：
文献类型：
--
作者：
Bowes, D.;Yin, H.;Li, D.
X射线发射已经实现了使用电子束产生的伪火花低压放电，并利用作为诊断束检测。一个300 A，34 kV的PS源的电子束脉冲的3毫米直径的0.1毫米厚的钼靶上的冲击产生的X射线，通过使用一个小的，便携式X射线检测器检测。使用X射线光电探测器捕获微小尺寸物体的清晰X射线图像。这表明质子诱导X射线发射（PIXE）的诱导不仅作为束存在的指示器，而且作为未来的X射线源，用于材料的小斑点X射线成像。(C)2014爱思唯尔有限公司版权所有。
X-ray emission has been achieved using an electron beam generated by a pseudospark low-pressure discharge and utilised as a diagnostic for beam detection. A 300 A, 34 kV PS-sourced electron beam pulse of 3 mm diameter impacting on a 0.1 mm-thick molybdenum target generated X-rays which were detected via the use of a small, portable X-ray detector. Clear X-ray images of a micro-sized object were captured using an X-ray photodetector. This demonstrates the inducement of proton induced X-ray emission (PIXE) not only as an indicator of beam presence but also as a future X-ray source for small-spot X-ray imaging of materials. (C) 2014 Elsevier B.V. All rights reserved.