Removing surface damages on FIB-prepared TEM specimens by using plasma cleaner

Removing surface damages on FIB-prepared TEM specimens by using plasma cleaner
复制标题

使用等离子清洁器去除 FIB 制备的 TEM 样品的表面损伤

DOI:
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发表时间:
2006
期刊:
J.Electron Microsco. (in press)
影响因子:
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通讯作者:
et al.
et al.
中科院分区:
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文献类型:
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作者:
S.Hata;et al.

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