Using the ANOVA F-Statistic to Rapidly Identify Near-Field Vulnerabilities of Cryptographic Modules

Using the ANOVA F-Statistic to Rapidly Identify Near-Field Vulnerabilities of Cryptographic Modules
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使用 ANOVA F 统计快速识别加密模块的近场漏洞

DOI:
10.1109/ims19712.2021.9575028
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发表时间:
2021
期刊:
IEEE MTT-S International Microwave Symposium (IMS
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通讯作者:
Yilmaz, Ali E.
Yilmaz, Ali E.
中科院分区:
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文献类型:
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作者:
Iyer, Vishnuvardhan V.;Yilmaz, Ali E.

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