Dewetting Process of Deuterated Polystyrene and Poly(vinyl methyl ether) Blend Thin Films via Phase Separation

Dewetting Process of Deuterated Polystyrene and Poly(vinyl methyl ether) Blend Thin Films via Phase Separation
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DOI:
10.1021/ma400506f
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发表时间:
2013-05
期刊:
影响因子:
5.5
通讯作者:
T. Xia;H. Ogawa;R. Inoue;K. Nishida;N. Yamada;Guang-xian Li;T. Kanaya
T. Xia;H. Ogawa;R. Inoue;K. Nishida;N. Yamada;Guang-xian Li;T. Kanaya
中科院分区:
化学1区
文献类型:
--
作者:
T. Xia;H. Ogawa;R. Inoue;K. Nishida;N. Yamada;Guang-xian Li;T. Kanaya

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利用时间分辨镜面和镜外中子反射率(NR)、镜面X射线反射率(XR)、光散射(LS)和光学显微镜(OM)等测试手段,研究了在石英衬底上用旋涂法制备的氢化聚苯乙烯(DPS)和聚甲基乙烯基醚(PVME)薄膜在温度跃迁到两相区后脱湿过程中的结构变化。OM和镜面XR测量表明,在脱湿前存在明显的潜伏期。在孕育期内,由于相分离,DPS和PVME之间的组成会发生波动。镜面反射分析结果表明,在薄膜表面温度沿深度方向跳跃后,薄膜的成分开始发生波动,导致薄膜上的成分梯度不均匀。通过非镜面NR和LS测量,也观察到在平面方向上的成分波动:非镜面NR测量...
We studied the structure development in the dewetting process of deuterated polystyrene (dPS) and poly(vinyl methyl ether) (PVME) thin films, which were prepared by a spin-coating method on a quartz substrate, after the temperature jump into the two-phase region, using time-resolved specular and off-specular neutron reflectivity (NR), specular X-ray reflectivity (XR), light scattering (LS), and optical microscope (OM) measurements. The OM and specular XR measurements showed that there clearly existed an incubation period before dewetting. In the incubation period, composition fluctuations between dPS and PVME were developed due to phase separation. The specular NR results revealed that composition fluctuations began to occur just after the temperature jump along the depth direction over the film, giving rise to the composition gradient heterogeneously over the film. Composition fluctuations were also observed in the in-plane direction by the off-specular NR and LS measurements: the off-specular NR measure...