ROLE OF THE FORCE OF FRICTION ON CURVED SURFACES IN SCANNING FORCE MICROSCOPY
ROLE OF THE FORCE OF FRICTION ON CURVED SURFACES IN SCANNING FORCE MICROSCOPY
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DOI：
10.1016/0039-6028(95)00122-0
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发表时间：
1995-05-10
期刊：
影响因子：
1.9
通讯作者：
CURELY, J
中科院分区：
文献类型：
--
作者：
AIME, JP;ELKAAKOUR, Z;CURELY, J
在近场显微镜中，原子力显微镜（AFM）是研究局部力学性能、摩擦和磨损的一种强大而通用的工具。特别地，摩擦的贡献的知识对于理解沉积在表面上的物体的结构可能变得至关重要。在本文中，我们表明，位于切接触平面之间的尖端和对象的摩擦力的贡献是依赖于扫描对象的几何形状。考虑针尖扫描曲面，推导了描述原子力显微镜两种接触模式：恒力和等高的一般表达式。
Among near field microscopes, the atomic force microscope (AFM) is a powerful and versatile tool for investigating local mechanical properties, friction and adhesiveness. Especially, the knowledge of the contribution of the friction may become of primary importance to understand the structure of the objects deposited on a surface. In this paper, we show that the contribution of the force of friction lying in the tangent contact plane between the tip and the object is dependent on the geometry of the object scanned. A tip scanning a curved surface is considered and a general expression is derived describing the two contact modes in AFM: constant force and constant height.