Inductance measurements in multilevel high Tc step‐edge grain boundary SQUIDS
Inductance measurements in multilevel high Tc step‐edge grain boundary SQUIDS
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多级高温阶梯边缘晶界 SQUIDS 中的电感测量
DOI：
10.1063/1.112858
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发表时间：
1994
影响因子：
4
通讯作者：
J. Przybysz
中科院分区：
文献类型：
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作者：
M. Forrester;A. Davidson;J. Talvacchio;J. Gavaler;J. Przybysz
研制了适合于数字电路应用的多电平高温超导量子干涉器件。该器件采用YBa 2Cu 3 O 7 −δ（YBCO）接地层、外延SrTiO 3绝缘体和YBCO微带层。结是通过阶跃边缘晶界工艺形成的，每个结的“低"侧都有接地平面接触，仅使用各向同性溅射和铣削技术。控制电流直接注入到SQUID环的微带段中，使我们能够测量微带电感，从而推断YBCO的磁穿透深度。SQUID在77 K以上工作，在该温度下，我们推断穿透深度为350 nm。穿透深度的温度依赖性被发现是在合理的协议与Gorter-Casimir形式接近Tc。
Multilevel high Tc SQUIDs, suitable for digital circuit applications, have been fabricated and tested. The devices employ a YBa2Cu3O7−δ (YBCO) ground plane, an epitaxial SrTiO3 insulator, and a YBCO microstrip layer. Junctions are formed by the step‐edge grain boundary process, with a ground plane contact for the ‘‘low’’ side of each junction, using only isotropic sputtering and milling techniques. Control current is directly injected in a microstrip segment of the SQUID loop, allowing us to measure the microstrip inductance, and thus to infer the magnetic penetration depth of the YBCO. The SQUIDs are operational above 77 K, at which temperature we infer a penetration depth of 350 nm. The temperature dependence of the penetration depth is found to be in reasonable agreement with the Gorter–Casimir form close to Tc.
“1. 超导和约瑟夫森电路 QED”，“2. 混合量子系统”。
DOI：
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发表时间：
2012
期刊：
影响因子：
--
作者：
Hiroaki Matsumiya;Hiroto Inoue;Masataka Hiraide;Kouichi Semba
通讯作者：
Kouichi Semba