Research on Single Event Transients in Linear Voltage Regulators in a 28 nm Bulk CMOS Technology
Research on Single Event Transients in Linear Voltage Regulators in a 28 nm Bulk CMOS Technology
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DOI：
10.1109/tns.2023.3322594
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发表时间：
2024-04
影响因子：
1.8
通讯作者：
Fan Shen;Jianjun Chen;Yaqing Chi;Bin Liang;Hanhan Sun;Yi Wen;Hao Guo;Xun Wang
中科院分区：
文献类型：
--
作者：
Fan Shen;Jianjun Chen;Yaqing Chi;Bin Liang;Hanhan Sun;Yi Wen;Hao Guo;Xun Wang
通过实验和仿真研究了两种28 nm体CMOS线性稳压器的单粒子瞬态（SET）灵敏度。这两种稳压器之间的差异在于误差放大器（EA）的结构、EA的负载电容和功率MOSFET的尺寸。重离子实验表明，两种调节器的SET响应具有不同的幅度和宽度。SPICE仿真结果表明，激励放大器的负载电容会影响SET的幅值。功率MOSFET的尺寸对幅度或宽度的影响很小。简单折叠共源共栅放大器的调节器中的SET比互补折叠共源共栅（CFC）放大器的调节器具有更低的幅度和更短的宽度。功率MOSFET栅极节点上的电容通过MOSFET的尺寸充电，这决定了瞬态幅度的变化。此外，瞬态宽度的大小由MOSFET的大小确定，功率MOSFET的栅极节点上的电容器通过MOSFET的大小放电。本文的研究结果为SET硬化提供了参考。
Single event transients (SETs) sensitivity in two 28 nm bulk CMOS linear voltage regulators are studied by experiments and simulations. The differences between the two regulators are the structure of error amplifiers (EAs), load capacitance of EA, and size of power MOSFETs. The heavy ion experiments show that the SET responses of the two regulators have different amplitudes and widths. The SPICE simulation results reveal that the load capacitance of EAs can affect the amplitude of SETs. The sizes of power MOSFETs have little influence on the amplitude or width. The SETs in the regulator with the simply folded cascode amplifier have lower amplitudes and shorter widths than that of the regulator with the complementary folded cascode (CFC) amplifier. It is the size of MOSFETs that the capacitor on the gate node of power MOSFETs is charged through that determines the variation of transient amplitude. Moreover, the size of the transient width is determined by the size of the MOSFETs through which the capacitor on the gate node of power MOSFETs is discharged. The result of this article offers a reference for SET hardening.