Ceramic layer epitaxy by pulsed laser deposition in an ultrahigh vacuum system
Ceramic layer epitaxy by pulsed laser deposition in an ultrahigh vacuum system
复制标题
在超高真空系统中通过脉冲激光沉积进行陶瓷层外延
DOI:
10.1063/1.105002
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发表时间:
1991
影响因子:
4
通讯作者:
M. Yoshimoto
中科院分区:
文献类型:
--
作者:
H. Koinuma;H. Nagata;Tadashi Tsukahara;S. Gonda;M. Yoshimoto
Ceramic layer epitaxy, defined as the epitaxial growth of ceramic thin films with thicknesses regulated on an atomic scale, was verified by a new method using pulsed laser deposition in ultrahigh vacuum (UHV). The intensity oscillation of reflection high‐energy electron diffraction (RHEED) was observed in an ArF excimer laser deposition of CeO2 and SrTiO3 films on Si(111) and SrTiO3(001) substrates, respectively, at 650–750 °C under 5×10−7 Pa. The oscillation periodicities corresponded well to interplane distances of CeO2(111) and SrTiO3(001). This first observation of RHEED oscillation in laser deposition of ceramic films suggests that UHV laser deposition is a promising method for producing atomically regulated ceramic layers inclusive of possible new high Tc superconductors.