High definition aperture probes for near-field optical microscopy fabricated by focused ion beam milling
High definition aperture probes for near-field optical microscopy fabricated by focused ion beam milling
复制标题
通过聚焦离子束铣削制造的用于近场光学显微镜的高清孔径探针
DOI：
10.1063/1.121564
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发表时间：
1998
期刊：
影响因子：
--
通讯作者：
N. F. Hulst
中科院分区：
文献类型：
--
作者：
J. Veerman;A. Otter;L. Kuipers;N. F. Hulst
我们用聚焦离子束球磨改善了近场扫描光学显微镜用镀铝光纤探头的光学特性。这种处理产生了一个没有铝颗粒的平端面，包含一个定义明确的圆对称孔径，直径可控到20 nm。尖端的偏振行为是圆对称的，偏振比超过1：100。通过单分子荧光的测量，证明了改进后的成像特性。与未经修改的探针相比，计数率增加了一个数量级以上，分子图像绘制了孔径的空间电场分布，与计算结果一致。(C)1998年美国物理研究所。
We have improved the optical characteristics of aluminum-coated fiber probes used in near-field scanning optical microscopy by milling with a focused ion beam. This treatment produces a flat-end face free of aluminum grains, containing a well- defined circularly-symmetric aperture with controllable diameter down to 20 nm. The polarization behavior of the tips is circularly symmetric with a polarization ratio exceeding 1:100. The improved imaging characteristics are demonstrated by measuring single molecule fluorescence. Count rates increase more than one order of magnitude over unmodified probes, and the molecule images map a spatial electric field distribution of the aperture in agreement with calculations. (C) 1998 American Institute of Physics.