Realization of Room-Temperature Phonon-Limited Carrier Transport in Monolayer MoS2 by Dielectric and Carrier Screening

Realization of Room-Temperature Phonon-Limited Carrier Transport in Monolayer MoS2 by Dielectric and Carrier Screening
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通过介质和载流子屏蔽实现单层MoS2中室温声子限制载流子输运

DOI:
10.1002/adma.201503033
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发表时间:
2016-01-20
期刊:
影响因子:
29.4
通讯作者:
Wang, Xinran
Wang, Xinran
中科院分区:
材料科学1区
文献类型:
--
作者:
Yu, Zhihao;Ong, Zhun-Yong;Wang, Xinran

文献摘要

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通过将高卡伯介电基板和高密度载流子相结合,可以有效地筛选MoS2中的库仑杂质,从而首次在单层MoS2晶体管中实现前所未有的约150 cm(2) V-1 s(-1)的室温迁移率和室温声子限制传输。
By combining a high-kappa dielectric substrate and a high density of charge carriers, Coulomb impurities in MoS2 can be effectively screened, leading to an unprecedented room- temperature mobility of approximate to 150 cm(2) V-1 s(-1) and room-temperature phonon-limited transport in a mono layer MoS2 transistor for the first time.