Determination of Real Space Residual Stress Distributions σij(z) of Surface Treated Materials with Diffraction Methods Part II: Energy Dispersive Approach
Determination of Real Space Residual Stress Distributions σij(z) of Surface Treated Materials with Diffraction Methods Part II: Energy Dispersive Approach
复制标题
用衍射法测定表面处理材料的真实空间残余应力分布 σij(z) 第二部分：能量色散法
DOI：
10.4028/www.scientific.net/msf.524-525.37
复制
发表时间：
2006
期刊：
影响因子：
--
通讯作者：
C. Genzel
中科院分区：
文献类型：
--
作者：
Ingwer A. Denks;M. Klaus;C. Genzel
在真实的空间中的近表面残余应力梯度的检测需要对于衍射矢量相对于样品坐标系的任何取向的高深度分辨率。为了满足这一要求，狭缝不再像应变扫描实验那样固定在实验室坐标系中，而是直接与样品耦合。因此，样品内的计量体积取向保持恒定，并且允许在真实的空间中执行深度分辨的sin2 π测量。该方法的精度取决于规范体积的定义，这是详细的调查。除了对σ（τ）与σ（z）关系的评估（这在X射线残余应力梯度分析中具有根本意义）之外，该方法还将被证明在相当精细的样品几何形状（如多层系统）中具有独特的适用性。
The detection of near surface residual stress gradients in real space requires high depth resolution for any orientation of the diffraction vector with respect to the sample co-ordinate system. In order to meet this demand, the slits are no longer being fixed in the laboratory co-ordinate system as in strain scanning experiments but directly coupled with the sample. Hence, the gauge volume orientation within the sample remains constant and allows performing depth-resolved sin2ψ measurements in real space. The method’s accuracy is determined by the gauge volume definition, which is investigated in detail. Apart from the evaluation of the σ(τ) versus σ(z) relation, which is of fundamental interest in X-ray residual stress gradient analysis, the method will be shown to have a unique applicability in rather delicate sample geometries such as multilayer systems.