Reconfigurable Field Programmable Gate Arrays: Failure Modes and Analysis
Reconfigurable Field Programmable Gate Arrays: Failure Modes and Analysis
复制标题
可重构现场可编程门阵列:故障模式和分析
DOI:
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发表时间:
2011
期刊:
影响因子:
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通讯作者:
M. Violante
中科院分区:
文献类型:
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作者:
N. Battezzati;L. Sterpone;M. Violante
Nowadays, electronic devices are used in a huge number of applications, from entertainment market to military equipment, from personal computing to large-scale business frameworks, from mobile phones to satellites and space probes. Each application has its own requirements and constraints, each of which weight in a different fashion depending on the specifications of the mission to be fulfilled. One particular kind of applications is the one called mission critical. Mission-critical applications are usually characterized by the involvement of a huge amount of money that could be suddenly lost if something goes wrong. This is the case of satellites, for example, that cannot be repaired nor returned for maintenance if some part stops working. This is also the case of bank applications where an error during a transaction could cause the loss or stealing of huge sums of money.