Cathodoluminescence of defects in sintered tin oxide
Cathodoluminescence of defects in sintered tin oxide
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DOI：
10.1063/1.1647267
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发表时间：
2004-03-15
影响因子：
3.2
通讯作者：
Piqueras, J
中科院分区：
文献类型：
--
作者：
Maestre, D;Cremades, A;Piqueras, J
利用扫描电子显微镜（SEM）中的阴极射线发光（CL）研究了氧化锡的发光机理。已发现由高纯度粉末制备的烧结材料显示出CL发射对样品制备期间施加的热处理的强烈依赖性。SEM图像显示纳米和微晶晶粒的存在。通过化学发光显微镜和光谱分析了晶粒尺寸和形貌与光发射的相关性。取决于烧结处理，主发射带出现在约2.58、2.25和1.94 eV处为中心。CL图像显示，2.25和2.58 eV的频带相关联的特定晶面。机械铣削的发光带的演变显示了复杂的演变的1.94和2.58 eV的排放，这是解释在铣削过程中的缺陷的形成和恢复。(C)2004年，美国物理学会。
Cathodoluminescence (CL) in the scanning electron microscope (SEM) has been used to investigate the luminescence mechanisms in tin oxide. Sintered material prepared from high purity powder has been found to show a strong dependence of the CL emission on the thermal treatments applied during sample preparation. SEM images show the presence of nano and microcrystalline grains. The correlation of the grain size and morphology with the optical emission is analyzed by CL microscopy and spectroscopy. The main emission bands appear centered at about 2.58, 2.25, and 1.94 eV depending on the sintering treatment. CL images reveal that the 2.25 and the 2.58 eV bands are associated at specific crystal faces. The evolution of the luminescence bands with mechanical milling shows a complex evolution of the 1.94 and 2.58 eV emissions which is explained by formation and recovery of defects during milling. (C) 2004 American Institute of Physics.