Demonstration of X-Ray Talbot interferometry
Demonstration of X-Ray Talbot interferometry
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DOI：
10.1143/jjap.42.l866
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发表时间：
2003-07-15
期刊：
影响因子：
--
通讯作者：
Suzuki, Y
中科院分区：
文献类型：
--
作者：
Momose, A;Kawamoto, S;Suzuki, Y
第一个在硬x射线区域的塔尔博特干涉测量是通过在玻璃板上形成金条纹制成的一对透射光栅来演示的。通过将x射线光轴上的光栅与第一个光栅引起的塔尔博特效应的分离对齐，产生了使一个光栅在光轴周围与另一个光栅稍微倾斜的云纹条纹。用莫尔条纹弯曲法检测了放置在第一个光栅前的相位物体。采用移相干涉测量技术，还可以测量出相物所对应的差相。这一结果表明，x射线塔尔博特干涉法是一种新的、简便的相敏x射线成像方法。
First Talbot interferometry in the hard X-ray region was demonstrated using a pair of transmission gratings made by forming gold stripes on glass plates. By aligning the gratings on the optical axis of X-rays with a separation that caused the Talbot effect by the first grating, moire fringes were produced inclining one grating slightly against the other around,the optical axis. A phase object placed in front of the first grating was detected by moire-fringe bending. Using the technique of phase-shifting interferometry, the differential phase corresponding to the phase object could also be measured. This result suggests that X-ray Talbot interferometry is a novel and simple method for phase-sensitive X-ray radiography.