Two-photon Observations of Dielectronic Recombination Processes
Two-photon Observations of Dielectronic Recombination Processes
复制标题
双电子复合过程的双光子观测
DOI：
10.1088/0031-8949/2011/t144/014047
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发表时间：
2011
期刊：
影响因子：
--
通讯作者：
N
中科院分区：
文献类型：
--
作者：
Zhi-min Hu; Yue-ming Li; Yamazaki;A.; Nakamura;N
本文给出了类氢氪双电子复合过程中发射的两条K射线的符合测量结果。我们报告的第一次观察到明确的符合信号从两个Ge探测器放置在这样一种方式，东京电子束离子阱是他们之间。通过将符合计数归一化为辐射复合X射线计数来获得双微分截面。
We present here coincidence measurements for two K x-rays emitted in the dielectronic recombination process of hydrogen-like krypton. We report the first observation of clear coincidence signals obtained from two Ge detectors placed in such a way that the Tokyo electron beam ion trap was between them. The doubly differential cross section is obtained by normalizing the coincidence counts to the radiative recombination x-ray counts.