The Standard S Control Chart with Run Rules

The Standard S Control Chart with Run Rules
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带有运行规则的标准 S 控制图

DOI：
10.1109/cdee.2010.85
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发表时间：
2010
期刊：
2010 First ACIS International Symposium on Cryptography, and Network Security, Data Mining and Knowledge Discovery, E-Commerce and Its Applications, and Embedded Systems
影响因子：
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通讯作者：
Li Xia
Li Xia
中科院分区：
--
文献类型：
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作者：
Huiquan Ma;Yu Ying;Xiao Cuiyi;Yun Xiao Qing;L. Ping;Li Xia

文献摘要

被引文献

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本文讨论了双运行规则标准控制图在过程可变性控制中的应用。用马尔可夫链方法计算了控制极限和平均行程长度。结果表明，对于各种位移大小，带游程规则的标准控制图的ARL均小于标准控制图。最后，通过一个算例和仿真，说明了运行规则图对过程变化性的变化更加敏感。
The application of standard control chart with two run rules in control of process variability is discussed in this paper. The control limits and average run length(ARL) are computed by the method of Markov chain. The results show that the standard control chart with run rules has smaller ARL than the standard control chart for all kinds of magnitudes of shifts. In the end, an example accompanied by simulation is used to illustrate that the chart with run rules is more sensitive to shifts in the process variability.