A Storage-Based Built-In Test Pattern Generation Method for Scan Circuits Based on Partitioning and Reduction of a Precomputed Test Set
A Storage-Based Built-In Test Pattern Generation Method for Scan Circuits Based on Partitioning and Reduction of a Precomputed Test Set
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基于预计算测试集划分和缩减的基于存储的内置扫描电路测试模式生成方法
DOI：
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发表时间：
2002
期刊：
影响因子：
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通讯作者：
S. Reddy
中科院分区：
文献类型：
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作者：
I. Pomeranz;S. Reddy
本文提出了一种扫描电路的内建测试图形生成方法。在这种方法下，一个预先计算的测试集被划分成几个集包含的主要输入或状态变量的值。这些集合被存储在片上，片上测试集通过实现各种集合的笛卡尔积来获得。为了减少存储要求和测试应用时间，在将集合存储在片上之前尽可能地减少集合。我们描述了两种方案，用于减少集的大小，一个是每个集存储的值的一个子集的主要输入或状态变量和一个单一的集合被用来存储值的状态变量的不同子集。我们证明了所提出的方法作为一个独立的程序，并作为一个计划的一部分，随机模式首先应用于检测易于检测的故障的有效性。在后一种情况下，所提出的方法被施加到检测难以检测的故障，仍然未被检测到。
We describe a built-in test pattern generation method for scan circuits. Under this method, a precomputed test set is partitioned into several sets containing values of primary inputs or state variables. The sets are stored on-chip and the on-chip test set is obtained by implementing the Cartesian product of the various sets. The sets are reduced as much as possible before they are stored on-chip in order to reduce the storage requirements and the test application time. We describe two schemes for reducing the set sizes, one where each set stores the values of one subset of primary inputs or state variables and one where a single set is used to store values of different subsets of state variables. We demonstrate the effectiveness of the proposed method as a stand-alone procedure and as part of a scheme where random patterns are first applied to detect easy-to-detect faults. In the latter case, the proposed method is applied to detect the hard-to-detect faults that remain undetected.