Off-device fault tolerance for digital imaging devices
Off-device fault tolerance for digital imaging devices
复制标题
数字成像设备的脱机容错
DOI：
10.1109/imtc.2004.1351127
复制
发表时间：
2004
期刊：
影响因子：
--
通讯作者：
Yong
中科院分区：
文献类型：
--
作者：
B. Jin;N. Park;K. M. George;N. Park;F. Lombardi;Yong
电荷耦合器件（CCD）是一种广泛应用于各种数字成像系统的光学传感器件技术，如数码相机、数码摄像机和数字x射线成像系统。CCD上的像素可能会由于许多原因而产生缺陷或故障像素，例如制造不完美，过度暴露于光辐射和传感元件老化等。随着高分辨率ccd使用的增加，这种器件的缺陷和容错性需要立即关注。在此背景下，本文提出了一种检测和修复这类设备上不具备设备内容错能力的缺陷/故障的技术，称为设备外容错。数字图像传感器设备，如CCD，就其性质而言，不能很容易地利用传统的设备上的容错技术，因为设备上的每个像素都感知一个唯一的图像像素坐标。由于原始像素坐标的任何位移都无法感知原始图像像素，因此稀疏像素无法替换或修复故障像素。因此，为了有效地提供和增强这种不能在器件上容错的器件的可修复性，本文在前人（Jin et al ., 2003）提出的CCD像元缺陷单分布和聚类分布软测试/修复方法的基础上，提出了一种新的CCD缺陷/故障测试/修复方法。由于不必要的扩散，聚类故障模型应被视为实用模型，并与单故障模型进行比较。此外，提出了一种新的默认/故障传播模型，以有效地捕获设备内影响和设备外故障，从而提高测试和维修过程的有效性和实用性。在聚类故障模型和单故障模型下，通过软测试/修复方法提高成品率（称为软成品率），证明了该方法的效率和有效性。进行了大量的数值模拟。
Charged-coupled device (CCD) is one of the widely-used optical sensing device technologies for various digital imaging systems such as digital cameras, digital camcorders, and digital X-ray imaging systems. Pixels on a CCD may suffer from defective or faulty pixels due to numerous causes such as imperfect fabrication, excessive exposure to light radiation and sensing element aging to mention a few. As the use of high-resolution CCDs increase, defect and fault tolerance of such devices demands immediate attention. In this context, this paper proposes a testing and repair technique for defects/faults on such devices with inability of on-device fault tolerance, referred to as off-device fault tolerance. Digital image sensor devices such as CCD are by their nature, can not readily utilize traditional on-device fault tolerance techniques because each pixel on the device senses a unique image pixel coordinate. No faulty pixel can be replaced nor repaired by a sparse pixel as any displacement of an original pixel coordinate can not sense the original image pixel. Therefore, to effectively provide and enhance the reparability of such devices with inability of on-device fault tolerance, a novel testing and repair method for defects/faults on CCD is proposed based on the soft testing/repair method proposed in our previous work (Jin et al, 2003) under both single and clustered distribution of CCD pixel defects. Clustered fault model due to unwanted diffusion should be considered as practical model and for comparison purpose with single fault model. Also, a novel default/fault propagation model is proposed to effectively capture the on-device effects and faults off the device for an effectiveness and practicality of testing and repair process. The efficiency and effectiveness of the method is demonstrated with respect to the yield enhancement by the soft-testing/repair method under a clustered fault model as well as single fault model, as referred to as soft yield. Extensive numerical simulations are concluded.