X‐mode broadband reflectometric density profile measurements on DIII‐D
X‐mode broadband reflectometric density profile measurements on DIII‐D
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DOI：
10.1063/1.1141971
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发表时间：
1990-10
影响因子：
1.6
通讯作者：
E. Doyle;T. Lehecka;N. Luhmann;W. Peebles
中科院分区：
文献类型：
--
作者：
E. Doyle;T. Lehecka;N. Luhmann;W. Peebles
一个50-75 GHz， X模式，宽带反射计系统安装并在DIII - D上运行。密度分布已在广泛的操作条件下获得，包括欧姆，L -和H -模式操作。与汤姆逊散射得到的剖面有很好的一致性，但仅适用于快速扫描。剖面是利用稳定的数值反演算法从线积分相位数据中计算出来的。使用这些技术，考虑到管的重置时间，密度曲线可以每2.5 ms测量一次。该系统仍在开发中：通过增加额外的50-75 GHz BWO和混频器，该系统将被重新配置，也可以作为相关反射计。
A 50–75 GHz, X‐mode, broadband reflectometer system is installed and operational on DIII‐D. Density profiles have been obtained under a wide range of operating conditions, including Ohmic, L‐, and H‐mode operation. Good agreement has been found with profiles obtained by Thomson scattering, but only with the use of fast sweeps. Profiles are calculated from the line‐integrated phase data using a stable numerical inversion algorithm. Using these techniques, and allowing for the reset time of the tube, density profiles can be measured every 2.5 ms. The system is still under development: By adding an additional 50–75 GHz BWO and mixers, the system will be reconfigured to also act as a correlation reflectometer.