Advanced Computing in Electron Microscopy
Advanced Computing in Electron Microscopy
复制标题
DOI:
10.1007/978-1-4419-6533-2
复制
发表时间:
1998
期刊:
影响因子:
--
通讯作者:
E. Kirkland
中科院分区:
文献类型:
--
作者:
E. Kirkland
A longer discussion of imaging with aberration correctors and the effects of the multitude of aberrations they produce has been added, along with a short discussion of ABF (annular bright field) and GPUs (graphical processing units) for faster numerical calculations.