Advanced Computing in Electron Microscopy

Advanced Computing in Electron Microscopy
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DOI:
10.1007/978-1-4419-6533-2
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发表时间:
1998
期刊:
--
影响因子:
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通讯作者:
E. Kirkland
E. Kirkland
中科院分区:
其他
文献类型:
--
作者:
E. Kirkland

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增加了对像差校正器成像及其产生的大量像差的影响的较长讨论,沿着对ABF(环形亮场)和GPU(图形处理单元)的简短讨论,以加快数值计算。
A longer discussion of imaging with aberration correctors and the effects of the multitude of aberrations they produce has been added, along with a short discussion of ABF (annular bright field) and GPUs (graphical processing units) for faster numerical calculations.