NIST High Accuracy Reference Reflectometer-Spectrophotometer.
NIST High Accuracy Reference Reflectometer-Spectrophotometer.
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DOI：
10.6028/jres.101.061
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发表时间：
1996-09
影响因子：
1.5
通讯作者：
Yvonne Barnes P
中科院分区：
文献类型：
--
作者：
Proctor JE;Yvonne Barnes P
采用最先进的技术设计和制造了一种新型反射计-分光光度计，以增强在紫外、可见和近红外 (UV-Vis-NIR) 波长范围（200 nm 至 2500 nm）内材料测量的光学特性。该仪器名为光谱三功能自动参考反射仪（STARR），能够测量漫反射样品的镜面反射率和漫反射率、双向反射率分布函数（BRDF）以及漫反射和非漫透射率。可以测量最大 30 cm x 30 cm 的样品。描述了该仪器及其特性。
A new reflectometer-spectrophotometer has been designed and constructed using state-of-the-art technology to enhance optical properties of materials measurements over the ultraviolet, visible, and near-infrared (UV-Vis-NIR) wavelength range (200 nm to 2500 nm). The instrument, Spectral Tri-function Automated Reference Reflectometer (STARR), is capable of measuring specular and diffuse reflectance, bidirectional reflectance distribution function (BRDF) of diffuse samples, and both diffuse and non-diffuse transmittance. Samples up to 30 cm by 30 cm can be measured. The instrument and its characterization are described.