Contact angle goniometry, ellipsometry, and time-of-flight secondary ion mass spectrometry of gold supported, mixed self-assembled monolayers formed from alkyl mercaptans
Contact angle goniometry, ellipsometry, and time-of-flight secondary ion mass spectrometry of gold supported, mixed self-assembled monolayers formed from alkyl mercaptans
复制标题
由烷基硫醇形成的金负载混合自组装单分子层的接触角测角法、椭圆光度法和飞行时间二次离子质谱法
作者:
D. Offord;C. John;Mathew R. Linford;J. Griffin
The interfacial properties of organic thin films can be controlled andselected using the phenomenon of mono-layer self-assembly, 1 and interest in supported selfassembled monolayers (SAMs) has grown as their potential technical applications have been recognized. 2 Much information about the structures of SAMs and the processes that control their formation has been obtained by characterization of series of mixed SAMs in whichthe surface concentration ratio (Rsam) of two different adsorbates is systematically varied. 3· 4 Mixed SAMs have been generally characterizedby a combination of contact angle goniometry, 5 optical ellipsometry, 6 and X-ray pho-