Epitaxial growth of SiGe on Si substrate by printing and firing of Al-Ge mixed paste
Epitaxial growth of SiGe on Si substrate by printing and firing of Al-Ge mixed paste
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DOI:
10.7567/1347-4065/ab00e5
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发表时间:
2019-04-01
影响因子:
1.5
通讯作者:
Usami, Noritaka
中科院分区:
文献类型:
--
作者:
Fukami, Shogo;Nakagawa, Yoshihiko;Usami, Noritaka
We report on a simple liquid-phase epitaxy (LPE) of SiGe on Si (100) substrate based on printing and firing. LPE was performed using an Al-Ge mixed paste screen-printed on a Si (100) substrate followed by annealing above the Al-Ge eutectic temperature in air or in an Ar atmosphere. In the case of annealing in air at 800 degrees C, SiGe was formed between the mixed paste and the surface of the Si substrate. However, a wave-like oxide film was confirmed at the SiGe/Si interface, which hindered the growth of SiGe. On the other hand, annealing in the Ar atmosphere at 800 degrees C led to the successful formation of a more continuous, thicker SiGe film by suppressing the oxidation of Al. It can be concluded that LPE growth using printing and firing of Al-Ge mixed paste is a suitable method to grow SiGe with a low-cost and simple high-speed process. (C) 2019 The Japan Society of Applied Physics