A NITROGEN-GAS-STREAM CRYOSTAT FOR GENERAL X-RAY-DIFFRACTION STUDIES

A NITROGEN-GAS-STREAM CRYOSTAT FOR GENERAL X-RAY-DIFFRACTION STUDIES
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DOI:
10.1107/s0021889886089835
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发表时间:
1986-04-01
影响因子:
6.1
通讯作者:
GLAZER, AM
GLAZER, AM
中科院分区:
材料科学3区
文献类型:
--
作者:
COSIER, J;GLAZER, AM

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描述了一种通常适用于X射线衍射研究的连续氮气流冷却装置。该装置工作温度范围为77.4~323.0 K,精度为±0.1 K,整个温度范围内液氮恒定消耗率为0.5 l h−1。供应容器未加压,因此可以在对样品冷却没有任何明显影响的情况下进行再填充。
A continuous nitrogen-flow cooling device, generally applicable to X-ray diffraction studies, is described. The device works in the range 77.4 to 323.0 K with a precision of ±0.1 K and a liquid-nitrogen constant consumption rate of 0.5 l h−1 over the whole temperature range. The supply vessel is unpressurized, so that refilling can be done without any observable influence on the cooling of the sample.