Phase-contrast X-ray imaging with synchrotron radiation for materials science applications

Phase-contrast X-ray imaging with synchrotron radiation for materials science applications
复制标题

DOI:
10.1016/s0168-583x(02)01557-4
复制
发表时间:
2003-01-01
影响因子:
1.3
通讯作者:
Ando, M
Ando, M
中科院分区:
物理与天体物理4区
文献类型:
--
作者:
Stevenson, AW;Gureyev, TE;Ando, M

文献摘要

被引文献

相似文献

自从伦琴在一个多世纪前发现x射线以来,绝大多数的x射线照片都是在吸收对比和几何(射线)光学的基础上收集和解释的。最近,利用相衬效应在x射线图像中获得新的和互补信息的可能性受到了相当大的关注,无论是在实验室环境还是在同步加速器源(其中大部分活动是可以产生的高度相干x射线光束的结果)。相衬x射线成像能够从样品中的弱吸收特征提供改进的信息,以及改进的边缘清晰度。四种不同的实验安排,以实现在硬x射线体制相衬,为了材料的非破坏性表征的目的,将被描述。其中两种是基于平行光束几何结构的,分别在法国的ESRF和日本的AR上进行了演示;另外两个,在PLS在韩国和APS在美国演示,是基于球束几何。在每种情况下,使用了完全不同的x射线光学排列。一些图像模拟将被用来演示硬x射线相衬成像的显著特征和例子。将展示每个实验的结果。(C) 2002 Elsevier Science B.V.版权所有
Since Rontgen's discovery of X-rays just over a century ago the vast majority of radiographs have been collected and interpreted on the basis of absorption contrast and geometrical (ray) optics. Recently the possibility of obtaining new and complementary information in X-ray images by utilizing phase-contrast effects has received considerable attention, both in the laboratory context and at synchrotron sources (where much of this activity is a consequence of-the highly coherent X-ray beams which can be produced). Phase-contrast X-ray imaging is capable of providing improved information from weakly absorbing features in a sample, together with improved edge definition. Four different experimental arrangements for achieving phase contrast in the hard X-ray regime, for the purpose of non-destructive characterization of materials, will be described. Two of these, demonstrated at ESRF in France and AR in Japan, are based on parallel-beam geometry; the other two, demonstrated at PLS in Korea and APS in USA, are based on spherical-beam geometry. In each case quite different X-ray optical arrangements were used. Some image simulations will be employed to demonstrate salient features of hard X-ray phase-contrast imaging and examples. of results from each of the experiments will be shown. (C) 2002 Elsevier Science B.V. All rights reserved.