X-ray investigation of stress states in materials .3.
X-ray investigation of stress states in materials .3.
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DOI：
10.1002/mawe.19960270907
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发表时间：
1996-09-01
影响因子：
1.1
通讯作者：
Macherauch, E
中科院分区：
文献类型：
--
作者：
Eigenmann, B;Macherauch, E
晶体或部分晶体材料的X射线应力分析是基于弹性晶格应变的测定，该应变通过弹性理论转换为应力。X射线应力分析的sin（2）psi方法的发展和60年代用衍射仪代替薄膜室的发展，使X射线应力分析在随后的30年里，无论是在基本原理的认识方面，还是在实际应用方面，都取得了巨大的进展。本文概述了X射线应力分析的历史发展。射线应力分析和描述了这一材料科学与工程重要工具的技术现状。除了X射线物理学和弹性理论的一些重要元素外，还概述了实际应用的实验方面。描述了标准测量程序和特殊测量问题，并给出了实际解决方案的提示。特别是，破坏性和非破坏性的残余应力的深度剖析，在薄涂层中的残余应力分析，在薄涂层的多层结构和化学梯度涂层中，在纹理的存在下的残余应力分析，在非均质材料中的残余应力和加载应力分析，在粗晶粒和单晶材料的例子。到目前为止建立的方法进行了解释，并指出了未来可能的发展。
X-ray stress analyses on crystalline or partially crystalline materials are based on the determination of elastic lattice strains which are converted to stresses by means of theory of elasticity. The development of the sin(2) psi-method of X-ray stress analysis and of diffractometers substituting film chambers during the 1960s initiated an enormous progress in X-ray stress analysis during the following three decades both in respect of the knowledge of the underlying principles and in respect of the practical application.This report sketches the historical development of X-ray stress analyses and describes the actual stale of the art of this important tool for materials science and engineering. Besides some important elements of X-ray physics and theory of elasticity, experimental aspects of practical applications are outlined. Standard measuring procedures and special measuring problems are described and hints for practical solutions are given. In particular, examples of destructive and non-destructive depth profiling of residual stresses, of residual stress analyses in thin coatings, in multilayer structures of thin coatings and in chemically graded coatings, of residual stress analyses in presence of textures, of residual and loading stress analyses in heterogeneous materials, in coarse grained, and in single crystalline materials are presented. The methods established up to now are explained and possible future developments are pointed out.