Surface recombination velocity effects on simulated electron beam induced current collected by a nanoscale electrode

Surface recombination velocity effects on simulated electron beam induced current collected by a nanoscale electrode
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表面复合速度对纳米电极收集的模拟电子束感应电流的影响

DOI:
10.1016/j.spmi.2016.11.020
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发表时间:
2016
期刊:
影响因子:
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通讯作者:
A. Hdiy
A. Hdiy
中科院分区:
--
文献类型:
--
作者:
Q. Doan;A. Hamdouni;A. Hdiy

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