Interference between radiative and dielectronic recombinations of highly charged ions observed through the ion abundance in an electron beam ion trap
Interference between radiative and dielectronic recombinations of highly charged ions observed through the ion abundance in an electron beam ion trap
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通过电子束离子阱中的离子丰度观察到的高电荷离子的辐射和双电子重组之间的干扰
DOI:
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发表时间:
2009
期刊:
影响因子:
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通讯作者:
et al.
中科院分区:
文献类型:
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作者:
中村信行;et al.