Annealing Conditions of Bi2Sr2CaCu2O8+x/CeO2/r-plane Sapphire by MOD Method
Annealing Conditions of Bi2Sr2CaCu2O8+x/CeO2/r-plane Sapphire by MOD Method
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Bi2Sr2CaCu2O8 x/CeO2/r面蓝宝石MOD法退火条件
DOI:
10.1016/j.phpro.2013.04.082
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发表时间:
2013
期刊:
影响因子:
--
通讯作者:
M. Takeda
中科院分区:
文献类型:
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作者:
S. Suzuki;H. Shimakage;A. Kawakami;A. Saito;M. Takeda
We have been studying Bi2Sr2CaCu2O8+x (Bi-2212) thin films on CeO2 buffered r-plane sapphire substrates by a metal organic decomposition (MOD) method. The deposited Bi-2212 thin films showed the c-axis oriented, and the in-plane orientation of the films showed 4-fold symmetry. However, we had a problem that Bi-2212 thin films were dissipation by thermal decomposition when the thin films were annealed above 840°C in air atmosphere. In this study, we investigate the annealing conditions of Bi- 2212 thin films. We found TC of Bi-2212 thin films were dependence on the annealing condition such as a gas atmosphere and annealing times. The TC of Bi-2212 thin film annealed at 840°C for 60min in nitrogen atmosphere was 68.5K. On the other hand, in oxygen atmosphere, TC was 65K at the same annealing condition.