Efficient template generation for instruction-based self-test of processor cores
Efficient template generation for instruction-based self-test of processor cores
复制标题
高效模板生成，用于处理器内核基于指令的自测试
DOI：
10.1109/ats.2004.39
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发表时间：
2004
期刊：
影响因子：
--
通讯作者：
H. Fujiwara
中科院分区：
文献类型：
--
作者：
K. Kambe;M. Inoue;H. Fujiwara
提出了一种基于指令的处理器内核自检模板生成方法。测试程序模板是一个带有未指定操作数的指令序列，它代表了测试模式的证明和测试响应传播的路径，用于测试模块（MUT）。为了证明MUT输入的值，我们引入了MUT相邻寄存器的概念，使得可以考虑由来自其他模块的信号以及直接来自寄存器的信号确定的MUT的输入空间。考虑到指令的依赖性，我们有效地生成了可能的模板，每个模板调用寄存器之间的一个或多个数据传输。该方法还生成多个模板以有效地检测故障，这些模板可能覆盖不同的输入空间，从而产生不同的可检测故障集。
This paper presents a method of template generation for instruction-based self-test of processor cores. A test program template is an instruction sequence with unspecified operands, and represents paths for justification of test patterns and propagation of test responses for a module under test (MUT). In order to justify value of MUT inputs, we introduce a concept of adjacent registers of the MUT that makes it possible to consider input spaces of the MUT determined by signals from other modules as well as signals directly from registers. We efficiently generate possible templates considering dependence of instructions each of which invokes one or more data transfers between registers. The method also generates multiple templates in effective order to detect faults, which may cover different input spaces, and therefore, different detectable fault sets.