Nanoindentation of glass with a tip-truncated Berkovich indenter
Nanoindentation of glass with a tip-truncated Berkovich indenter
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DOI：
10.1080/01418619608239710
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发表时间：
1996-11-01
期刊：
影响因子：
--
通讯作者：
Yoshizaki, H
中科院分区：
文献类型：
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作者：
Shimamoto, A;Tanaka, K;Yoshizaki, H
利用负载分辨率为0.1 μ N，位移分辨率为0.08 nm（rms）的纳米压痕仪，研究了基板玻璃在深度仅为5 nm处的纳米压痕行为。在位移控制条件下，该仪器能够检测压头尖端与样品表面的接触，精度为+/- 0.2 nm。用三维有限元法对截断的伯氏锥体压痕进行了实验分析。
The nanoindentation behaviour of a substrate glass to a depth of only 5 nm is examined by using a nanoindentation instrument with a load resolution of 0.1 mu N and a displacement resolution of 0.08 nm(rms). The instrument is capable of detecting contact of the indenter tip with the sample surface with the accuracy of +/- 0.2 nm when operated under displacement controlled conditions. The experimental results are analysed using a three-dimensional finite-element method on a truncated Berkovich pyramidal indentation.