Theory of phase spectroscopy in bimodal atomic force microscopy
Theory of phase spectroscopy in bimodal atomic force microscopy
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DOI：
10.1103/physrevb.79.014110
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发表时间：
2009-01-01
影响因子：
3.7
通讯作者：
Garcia, Ricardo
中科院分区：
文献类型：
--
作者：
Lozano, Jose R.;Garcia, Ricardo
我们发展了一个理论形式来描述双峰原子力显微镜（AFM）实验。该理论将振幅和相移等可观测值与尖端表面相互作用的物理性质联系起来。该理论适用于点质量模型和悬臂-尖端系统的连续模型。我们解释了双峰AFM在非常小的保守力影响下绘制成分变化的能力。这是通过表示一个特征模的相移或幅值相对于另一个模的幅值或相移的依赖关系来实现的。理论与数值模拟结果吻合，验证了理论的形式化。
We develop a theoretical formalism to describe bimodal atomic force microscopy (AFM) experiments. The theory relates observables such as amplitudes and phase shifts to physical properties of the tip-surface interaction. The theory is compatible with point-mass and continuous models of the cantilever-tip system. We explain the ability of the bimodal AFM to map compositional variations under the influence of very small conservative forces. This is achieved by representing the dependence of the phase shift or amplitude of one eigenmode with respect to the amplitude or phase shift of the other mode. The agreement obtained between the theory and the numerical simulations validates the theoretical formalism.