Development of Surface Fluorescence X-ray Absorption Fine Structure using a Laue-type Monochromator and its Application to Sub-Monolayer-Coverage Surface in Solution
Development of Surface Fluorescence X-ray Absorption Fine Structure using a Laue-type Monochromator and its Application to Sub-Monolayer-Coverage Surface in Solution
复制标题
使用劳厄型单色仪开发表面荧光 X 射线吸收精细结构及其在溶液中亚单层覆盖表面的应用
DOI：
10.1002/tcr.201800020
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发表时间：
2018
期刊：
影响因子：
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通讯作者：
Y. Iwasawa and K. Asakura
中科院分区：
文献类型：
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作者：
Y. Wakisaka;D. Kido;H. Uehara;Q. Yua;F.E. Feiten;S. Mukai;S. Takakusagi;Y. Uemura;T. Yokoyama;T. Wada;M. Uo;O. Sekizawa;T. Uruga;Y. Iwasawa and K. Asakura
利用劳厄型单色仪发展了表面荧光X射线吸收精细结构(XAFS)光谱，用于在有电解液存在的高度定向的热解石墨(HOPG)表面获得极低浓度金属的结构信息。通常情况下，表面荧光XAFS光谱会受到来自体的强散射的阻碍，这往往会扼杀脉冲计数检测器。在这项工作中，我们证明了弯曲晶体劳厄分析器(BCLA)即使在溶液存在的情况下也能有效地去除块体中的散射X射线。我们将这一技术应用于高性能光电倍增管上的亚单层(∼1014个原子厘米−_2)铂，成功地获得了高信噪比的 环境下的XAFS数据，并结合背光荧光XAFS光谱(BI-FXAFS)。这项技术允许在 情况下，在有电解液存在的情况下对平板电极表面进行XAFS测量。
Surface fluorescence X‐ray absorption fine structure (XAFS) spectroscopy using a Laue‐type monochromator has been developed to acquire structural information about metals with a very low concentrate on a flat highly oriented pyrolytic graphite (HOPG) surface in the presence of electrolytes. Generally, surface fluorescence XAFS spectroscopy is hindered by strong scattering from the bulk, which often chokes the pulse counting detector. In this work, we show that a bent crystal Laue analyzer (BCLA) can efficiently remove the scattered X‐rays from the bulk even in the presence of solution. We applied the technique to submonolayer (∼1014atoms cm−2) Pt on HOPG and successfully obtained high signal/noisein situXAFS data in combination with back‐illuminated fluorescence XAFS (BI‐FXAFS) spectroscopy. This technique allowsin situXAFS measurements of flat electrode surfaces to be performed in the presence of electrolytes.