Precise stress measurements with white synchrotron x rays.
Precise stress measurements with white synchrotron x rays.
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DOI：
10.1063/1.3263760
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发表时间：
2010-01
期刊：
影响因子：
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通讯作者：
D. Weidner;M. Vaughan;Liping Wang;H. Long;Li Li-Li;N. Dixon;W. Durham
中科院分区：
文献类型：
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作者：
D. Weidner;M. Vaughan;Liping Wang;H. Long;Li Li-Li;N. Dixon;W. Durham
多晶样品中应力的原位测量是研究具有非常广泛的地球科学和材料科学应用的材料的机械性能的基础。同步加速器x射线被用来定义这些样品中的局部弹性应变，这反过来又定义了应力。到目前为止，已经在原型检测系统上进行了实验工作，该系统提供了应变测量精度>；10(-4)，相当于硅酸盐矿物的应力分辨率>；50兆帕。在这里，我们报告了一种新的、永久性的、能量色散的白辐射探测系统的运行情况，该系统是在国家同步辐射光源上开发的。新系统提供的差动应变测量精度为3x10(-5)，体积为50x50x500微米(3)。这为硅酸盐矿物提供了大约10兆帕的应力精度。
In situ measurement of stress in polycrystalline samples forms the basis for studies of the mechanical properties of materials with very broad earth science and materials science applications. Synchrotron x rays have been used to define the local elastic strain in these samples, which in turn define stress. Experimental work to date has been carried out on a prototype detection system that provided a strain measurement precision >10(-4), which corresponds to a stress resolution >50 MPa for silicate minerals. Here we report operation of a new, permanent, energy dispersive detection system for white radiation, which has been developed at the National Synchrotron Light Source. The new system provides differential strain measurements with a precision of 3 x 10(-5) for volumes that are 50 x 50 x 500 microm(3). This gives a stress precision of about 10 MPa for silicate minerals.