Modeling of non-contact atomic force microscope with two-term excitations
Modeling of non-contact atomic force microscope with two-term excitations
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DOI：
10.1088/1757-899x/971/4/042052
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发表时间：
2020-12
期刊：
影响因子：
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通讯作者：
M. Bahrami
中科院分区：
文献类型：
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作者：
M. Bahrami
本文的目的是研究原子力显微镜悬臂梁在非接触工作模式下的动力学行为。采用集总参数法建立悬臂梁的数学模型。悬臂梁的尖端受到两个简谐项的激励，并与样品表面相互作用。范德华力，针尖-样品相互作用力，使系统变得非线性。利用多尺度法建立了频率响应方程。研究了其对激励幅值、阻尼系数和初始试件尖端距离的影响。
The goal of this article is to study the dynamical behavior of atomic force microscope cantilever in its non-contact mode of operation. The lumped parameter model is used to construct the mathematical model of the cantilever. The tip of the cantilever is excited by two harmonic terms and is in interaction with the sample surface. The Van der Waals force, tip-sample interaction force, makes the system nonlinear. Using multiple scales method, the frequency response equation is found. The effects on the amplitude of excitations, the damping coefficient, and initial sample – tip distance is studied and presented as the results.