Coherent optical adaptive technique improves the spatial resolution of STED microscopy in thick samples.
Coherent optical adaptive technique improves the spatial resolution of STED microscopy in thick samples.
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DOI：
10.1364/prj.5.000176
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发表时间：
2017-06-01
影响因子：
7.6
通讯作者：
Ye T
中科院分区：
文献类型：
--
作者：
Yan W;Yang Y;Tan Y;Chen X;Li Y;Qu J;Ye T
受激发射耗尽显微镜（STED）是一种能够提供亚衍射空间分辨率的远场光学显微镜技术。STED显微镜的空间分辨率是由耗尽光束及其功率的特殊设计光束轮廓决定的。然而，由于光学系统的像差和样品光学特性的不均匀性，耗尽光束的光束轮廓可能会畸变，从而导致空间分辨率降低。当厚样本成像时，情况就会恶化。在最坏的情况下，无论施加多大的耗尽功率，耗尽光束轮廓的严重畸变都可能导致超分辨效果完全丧失。以前已经探索了几种自适应光学方法来补偿系统和样品的像差。然而，标本复杂的高阶像差很难校正。在本报告中，我们证明了利用相干光自适应技术（COAT）可以测量厚模体样品的复杂畸变波前。全校正可以有效地保持和提高成像厚样的空间分辨率。
Stimulated emission depletion microscopy (STED) is one of far-field optical microscopy techniques that can provide sub-diffraction spatial resolution. The spatial resolution of the STED microscopy is determined by the specially engineered beam profile of the depletion beam and its power. However, the beam profile of the depletion beam may be distorted due to aberrations of optical systems and inhomogeneity of specimens’ optical properties, resulting in a compromised spatial resolution. The situation gets deteriorated when thick samples are imaged. In the worst case, the sever distortion of the depletion beam profile may cause complete loss of the super resolution effect no matter how much depletion power is applied to specimens. Previously several adaptive optics approaches have been explored to compensate aberrations of systems and specimens. However, it is hard to correct the complicated high-order optical aberrations of specimens. In this report, we demonstrate that the complicated distorted wavefront from a thick phantom sample can be measured by using the coherent optical adaptive technique (COAT). The full correction can effectively maintain and improve the spatial resolution in imaging thick samples.